Zeiss Auriga Focused Ion Beam FE SEM

Basic Information
Name/Model #: 
Auriga dual beam FIB SEM
Focused Ion Beam (Gallium source) Scanning electron microscope
Location Information
Room #: 
Contact Information
Contact Name: 
Richard Noll
Phone number: 
Advanced Information
Features & Accessories: 

With ZEISS FIB-SEMs or Focused Ion Beam Scanning Electron Microscopes you speed up nanotomography and nanofabrication applications. These scanning electron microscopes combine 3D imaging technology and analysis performance of the Gemini electron beam column with the ability of a focused ion beam for material processing, research and sample preparation on a nanoscopic scale. In addition to outstanding performance, you benefit from maximum stability and a uniform beam profile. Last but not least the graphical control interface of the FIB-SEM is easy to understand and allows interaction in real time.