The purpose of this course is to provide the theoretical background required for use of the electron microprobe (EMP) and scanning electron microscope (SEM) for scientific research. Students will receive hands-on experience with the Hitachi S3400 SEM and the Cameca SX51 electron probe in the course of lab exercises. Full training for independent use of these instruments in an individual’s research is arranged at the time when her/his samples are ready and he/she is ready to begin a regular schedule of instrument use. For more information, please contact John Fournelle. Occasionally a Geology 875 ‘short course’ -- a compressed version of Geology 777 -- on SEM and electron probe microanalysis (EPMA) is offered and John Fournelle should be contacted for details regarding this course.